The Department of Electronics and Communication Engineering at Punjab Engineering College (Deemed to be University), Chandigarh, in collaboration with IEEE Chandigarh Subsection, hosted a special awareness session on the Graduate Aptitude Test in Engineering (GATE). The event featured Dr. Neha Sardana and Dr. Kailash Chandra Jena from IIT Ropar as keynote speakers, alongside Prof. Arun Kumar Singh (Head, ECE), Dr. Simranjit Singh, and Dr. Jaskirat Kaur.
GATE is one of India’s most prestigious entrance exams, enabling students from B.E./B.Tech./M.Sc. programs to pursue Master’s and Ph.D. degrees at top institutions. Additionally, GATE scores are widely used for recruitment by Public Sector Units (PSUs). For 2025, GATE will be conducted by IIT Roorkee, and the Joint Admission Test for Masters (JAM) will be organized by IIT Delhi, both on behalf of the Ministry of Education (MoE).
This session aimed to raise awareness among students about the opportunities GATE and JAM present.
Dr. Neha Sardana shared valuable strategies for cracking the GATE exam, emphasizing key areas of focus. Dr. K.C. Jena provided technical insights, explaining how GATE scores can unlock job opportunities in PSUs.
The session left students well-informed and motivated, providing them with a clearer understanding of the vast opportunities available in government, PSUs, and private sector organizations through GATE.
