Deepak Kumar Sharma
| Department | Electronics and Communication Engineering |
| Designation | Assistant Professor |
| Qualification | B.Tech, BBDIT Ghaziabad MS Research, IIT Mandi PhD , IIT Roorkee, Former Scientist (ISRO Bangalore), All India Rank:1 (ISRO Entrance for Scientist) |
| Research Interests | Nanoscale MOSFETs, MEMS Inertial Sensors, MEMS based Quadrupole Mass Spectrometer, Thin Film Transistors |
|
deepaksk@pec.edu.in ( Official )
deepaksk1526@gmail.com ( Personal ) |
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| Phone Number |
9389585817 ( Resdence ) |
| Sr. No. | Title |
|---|---|
| 26 | Amit Chauhan, Deepak K. Sharma, Arnab Datta “Rate limited filament formation in Al-ZnO-Al bipolar ReRAM cells and its impact on early current window closure during cycling” Journal of Applied Physics, AIP, vol. 125, pp. 104503, 2019 |
| 27 | Deepak K. Sharma, Robin Khosla, Satinder K Sharma” Multilevel metal/Pb (Zr0.52Ti0.48) O3/TiOxNy/Si for next generation FeRAM technology node” Solid-State Electronics, vol. 111, pp. 42-46, 2015 |
| 28 | Robin Khosla, Deepak K. Sharma, Kunal Mondal, Satinder K Sharma “Effect of electrical stress on Au/Pb(Zr0.52Ti0.48)O3/TiOxNy/Si gate stack for reliability analysis of ferroelectric field effect transistors” Applied Physics Letters, vol. 105, Issue 15, pp. 152907, 2014 |
| Sr. No. | Title | Agency | Duration of Years |
|---|---|---|---|
| 1 | Member, DST PURSE Grant 2025 | Department of Science and Technology, Government of India, Funding 7.5 Cr | 5 |
| 2 | Simulation framework for Miniature Mass Spectrometsers | PEC Research Initiation Grant, Funding 10 Lakhs | 2 |
| 3 | Thin Film based Faraday Cup integrated with Thin Film Transistors for low Ion Current Measurements in Miniature Mass Spectrometers | Bhabha atomic research centre, Board of research in nuclear sciences (BRNS), Funding: 45 Lakhs | 3 |
| 4 | Fabrication of Source Gated Thin Film Transistors for Sensor Interfaces | INUP-i2i, IIT Delhi | 1 |
| 5 | Development of MEMS based Mass Spectrometer | Department of Space (Inhouse Project) | 3 |
| Sr. No. | Society | Duration |
|---|---|---|
| 1 | IEEE |